Advanced X-ray Instrumentation, Optics and Metrology

Date: Tuesday, 24 January 2023

Time: 09:00-17:00

Location: Seminar room Flash, Building 28c, 2nd floor, (DESY, Notkestraße 85, 22607 Hamburg)

Type: in-person meeting

 

Organizer: Maurizio Vannoni (EuXFEL), Liubov Samoylova (EuXFEL)

4th generation Synchrotron Sources and Free Electron Lasers pose very specific and often highly demanding requirements on the optical instrumentation. 
It is our interest to reinforce the community of optics experts, to share the results, and to join the efforts among the facilities.
In this satellite meeting we would like to warmly invite the experts, both scientists and engineers, of different facilities to discuss together the most recent experiences in the following topics: 

  • Advanced Optics Instrumentation, with particular regard about new designs, new devices and recent results
  • Optics Contamination and/or Damage
  • Recent developments in Metrology of X-ray Optical elements