Date: Monday, 23 January 2023
Time: 09:00-19:00
Location: E1.173 (European XFEL, Holzkoppel 4, Schenefeld)
Type: Hybrid meeting (in person and virtual)
Organizer: Carsten Deiter (EuXFEL), Ekaterina Round (EuXFEL), John Beale (PSI)
Modern X-ray sources offer the possibility to perform single shot experiments with high repetition rates. To enable sample delivery of fixed-targets with rates of up to 10Hz, the positions of the samples have to be known prior the experiment. In this workshop we will discuss strategies to standardize sample mounts and position descriptions. We will propose possible approaches to the necessary tasks. The workshop is split into two parts: The morning session focuses on the workflow for fixed-targets – especially sample pre-characterization and deep learning-based image recognition – and the afternoon session aims for standardization of carrier chips and data formats for fixed-targets in protein crystallography.