Heisenberg Resonant Inelastic X-Ray Spectrometer

The Heisenberg RIXS (hRIXS) spectrometer enables time-resolved resonant inelastic x-ray scattering / x-ray Raman scattering with high energy and temporal resolution, close to the transfer limit. As low-crossection technique, it makes use of the high repetition rate of the European XFEL. It can be used together with the XRD setup, for study of solid samples / quantum materials in UHV and cryogenic environment. It can be alternatively also used with the CHEM setup, for study of chemical systems / samples in liquid-jet environment. The scattering angle for the hRIXS spectrometer is variable and can be changed continuosly for the XRD setup.

Energy range: 400 eV - 1400 eV
Combined resolving power:
10000 (high-res mode)
7000 (medium-res mode)
3000 (low-res mode)
Readout rate 10 Hz
Scattering angles XRD: 65 deg - 145 deg (continuous)
Scattering angles CHEM: 45 deg, 90 deg, 125 deg

 

hRIXS motion in SCS hutch

The hRIXS spectrometer is installed on a high precision floor. Here, it is attached to the triple rotating flange of the XRD chamber, allowing continuous movement for scanning of the two theta scattering angle between 65 and 145 degrees.