Date: Monday, 20 January 2025 and Wednesday, 22 January 2025
Time: Full day and half day
Location: European XFEL, Holzkoppel 4, Schenefeld
Type: In person meeting
Organizers: Ekaterina Round
The Sample Environment and Characterization (SEC) group at the European XFEL operates multidisciplinary research infrastructure and offers access to state-of-the-art technologies providing complementary information on the samples being studied with the XFEL pulses. These include advanced imaging methods for a wide range of sample types, including biological and materials science applications. This satellite meeting aims to provide an overview of the key imaging instrumentation and techniques currently available in the European XFEL user laboratories, including the XBI laboratories, and highlight their areas of application. The satellite meeting offers early-career scientists the opportunity to join interactive tutorials covering a wide range of optical, electron and scanning probe microscopy topics. This event seeks to engage with the broader user community to explore strategies to expand available applications and envision the future needs, advancements and upgrades for imaging opportunities at the European XFEL user laboratories.