MID Workshop 2009

28–29 October 2009, ESRF, Grenoble, France

The Materials Imaging and Dynamics (MID) instrument aims at the investigation of nanosized structures and nanoscale dynamics using coherent radiation. Applications to a wide range of materials from hard to soft condensed matter and biological structures are envisaged. This meeting will present the scientific case but mainly focus on the technical specifications of the MID station. This will address in particular:

  • source properties (energy range, polarization)
  • experimental infrastructure (sample-chamber, temperature range, magnetic field, pump laser)
  • 2-D detector system
  • diagnostics, synchronization

Introduction and instrumentation

  • Status of the European X-Ray Free-Electron Laser

    Massimo Altarelli, European XFEL

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  • The MID instrument

    Thomas Tschentscher, European XFEL

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  • XPCS at XFEL or: How to measure S(q,t) at XFEL sources?

    Christian Gutt, DESY

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  • Coherent diffraction imaging using X-ray FELs

    Ivan Vartaniants, HASYLAB / DESY

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Coherent diffraction imaging and X-ray photon correlation spectroscopy

  • Probing dynamical heterogeneity by XPCS

    Luca Cipelletti, LCVN Montpellier

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  • Coherent X-ray diffraction for condensed matter physics

    Sylvain Ravy, SOLEIL

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  • Biological imaging and dynamics of biomolecular assemblies at XFEL

    Tim Salditt, Universität Göttingen

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  • Large-q photon correlation spectroscopy

    G. B. Stephenson, ANL

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  • Initial stages of crystallization

    Elias Vlieg, Radboud University Nijmegen

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  • X-ray cross correlation analysis

    Peter Wochner, MPI for Metals Research

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Instrumentation

  • The Coherent X-Ray Imaging (CXI) instrument at LCLS

    Sébastian Boutet, LCLS

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  • Area detector developments for CDI and XPCS experiments

    Heinz Graafsma, DESY

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  • The X-ray correlation spectroscopy instrument at LCLS

    Aymeric Robert, LCLS

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  • X-ray optic and beam transport effects to FEL radiation properties

    Harald Sinn, European XFEL

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Working groups: WG I (CXDI) and WG II (XPCS)

  • Working group I—CXDI: Introductory

    Convener: O. Thomas and I. Vartaniants

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  • Case for studies of bulk materials at XFEL?

    Henning Friis Poulsen, Risø DTU

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  • Coherent X-ray diffraction imaging with the XFEL

    Ian Robinson, London Centre for Nanotechnology

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  • Coherent diffraction imaging as a tool to investigate the mechanics of polycrystals

    N. Vaxelaire, IM2NP, Marseille

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  • Working group II—XPCS: Introductory

    Convener: Ch. Schüßler-Langeheine and G. Grübel

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  • Speckle contrast (assuming a perfectly disordered sample)

    A. Madsen, ESRF

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  • Atomic diffusion investigation by XPCS

    B. Sepiol, Universität Wien

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  • Phonons with XPCS

    Harald Sinn, European XFEL

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  • MID Workshop 2009: Report X-ray photon correlation spectroscopy working group

    June 2010

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