Publications

Peer-reviewed publications

• “Focusing of millijoule subpicosecond Kα radiation from 100 TW laser-solid interaction”
  A. Lévy, F. Dorchies, P. Audebert, J. Chalupský, V. Hájková, L. Juha, T. Kaempfer , H. Sinn, I. Uschmann , L. Vyśin and J. Gaudin
  Appl. Phys Lett. 96, 151114 (2010) LINK

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• "Damage of amorphous carbon induced by soft x-ray femtosecond pulses above and below the critical angle"
  J. Chalupský, V. Hájková, V. Altapova, T. Burian, A. J. Gleeson, L. Juha, M. Jurek, H. Sinn, M. Störmer, R. Sobierajski, K. Tiedtke, S. Toleikis, Th. Tschentscher, L. Vyšín, H. Wabnitz, and J. Gaudin
  Appl. Phys Lett. 95, 031111 (2009) LINK

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• "Exciton-exciton interactions in CdWO4 irradiated by intense femtosecond VUV pulses."
  M. Kirm, V. Nagirnyi, E. Feldbach, M. De Grazia, B. Carré, H. Merdji, S. Guizard, G. Geoffroy, J. Gaudin, N. Fedorov, P. Martin, A. Vasil’ev, A. Belsky
  Phys. Rev. B 79, 233103 (2009) LINK

Conference proceedings

• "Coupled thermo-mechanical simulations for European XFEL beamline optics"
  F. Yang, H. Sinn, J. Gaudin, G. Galasso, L. Samoylova, A. Trapp; Proc. Computational methods for coupled problems in science and engineering
  ECCOMAS thematic conference (2009)
• "Damage study for the design of the European XFEL beamline optics"
  J. Gaudin , H. Sinn, L. Samoylova, F. Yang, T. Tschentscher
  Proc. SPIE Vol. 7361, 736105 (2009); SPIE Europe Optics + Optoelectronics – XDAM 2
• "Damage studies of multilayer optics for XUV free electron lasers. E. Louis, A. R. Khorsand, R. Sobierajski, E. D. van Hattum, M. Jurek, D. Klinger, J. B. Pelka, L. Juha, J. Chalupský, J. Cihelka, V. Hajkova, U. Jastrow, S. Toleikis, H. Wabnitz, K. I. Tiedtke, J. Gaudin, E. M. Gullikson, and F. Bijkerk"
  Proc. SPIE Vol. 7361, 73610I (2009); SPIE Europe Optics + Optoelectronics – XDAM 2
• "Requirements on Hard X-ray Grazing Incidence Optics for European XFEL: Analysis and Simulation of Wavefront Transformations"
  L. Samoylova, H. Sinn, F. Siewert, H. Mimura, K. Yamauchi, T. Tschentscher
  Proc. SPIE Vol. 7360, 7360-11 (2009); SPIE Europe Optics + Optoelectronics – EUV and X-ray Optics