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Workshop/Conference

HED workshop 2009: International workshop on the High Energy Density science endstation and associated diagnostics and instrumentation at the European XFEL

Date and location: 30 March - 1 April 2009

The capability to produce material at ultra-high energy densities is one of the prioritized areas of science for the upcoming European XFEL facility as described in the Technical Design Report (PDF, 9.4 MB). Matter at such energy densities is of relevance to a number of fields of science, including basic plasma physics, materials in extreme environments, and planetary physics and astrophysics.

The workshop brought together scientists interested in using the High-Energy Density science instrument at the European XFEL in order to review the present state of the field, potential experiments, and the requirements for the facility in terms of beam characteristics, chamber configuration, diagnostics, associated instrumentation and data acquisition technology.

The workshop was co-funded by the European Commission through the Pre-XFEL project. Hosting the workshop and support by the Photon Science Research Institute of the UK Science and Technology Facilities Council is gratefully acknowledged.

More on the HED experiment station

Slides

Introduction & Status reports

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Thomas Tschentscher, European XFEL (1.3 MB, en)

Strong coupled plasmas & Plasma dynamics and spectroscopy

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Ronald Redmer, Universität Rostock (12.4 MB, en)
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Patrick Renaudin, CEA, DAM, DIF (1.0 MB, en)
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Frank Rosmej, UPMC & LULI (5.0 MB, en)
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Greg Tallents, University of York (670KB, en)

Excited solids & Novel instrumentation and diagnostics

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Patrick Audebert, LULI, Ecole Polytechnique (1.4 MB, en)
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Jean-Christophe Chanteloup, LULI, Ecole Polytechnique (5.9 MB, en)
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Bob Nagler, University of Oxford (1.9 MB, en)
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David Neely, STFC, Oxfordshire & University of Strathclyde, Glasgow (1.2 MB, en)
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Klaus Sokolowski-Tinten, Universität Duisburg Essen (3.2 MB, en)
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Justin Wark, University of Oxford (5.1 MB, en)
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Chris Youngman, European XFEL (3.7 MB, en)

Summaries

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Patrick Audebert et al. (92KB, en)
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Thomas Tschentscher, European XFEL (318KB, en)