FXE workshop 2009: International workshop on the science and instrumentation for Femtosecond X-ray Experiments at the European XFEL
Date and location: 9–11 December 2009
The FXE instrument for Femtosecond X-Ray Experiments will exploit the unique time structure and intensity of the European XFEL for structural dynamics studies of molecules, biological species and solid state materials. This instrument will allow new investigations of electronic and atomic structure changes that are not possible today. It will thus supplement to several fields of contemporary research including chemical and biological dynamics and solid state physics. Advanced X-Ray spectroscopies and scattering will be implemented with femtosecond time resolution, but also techniques that require the intense average XFEL flux are foreseen.
This meeting forms part of a series of workshops aiming to discuss scientific cases and designs of the European XFEL instruments. It features a number of invited lectures on scientific and technical aspects, followed by group sessions providing opportunities for extended discussions from broad user communities on the construction of the FXE instrument and its capabilities.
More on the FXE experiment station
Slides
Introduction & Status reports
Thomas Tschentscher, European XFEL (1.1 MB, en)
David Fritz, LCLS (2.0 MB, en)
Evgueni A. Schneidmiller, DESY (643KB, en)
Solid state dynamics
Matias Bargheer, Potsdam University (1.3 MB, en)
Robert Feidenhans’l, University of Copenhagen (3.0 MB, en)
Paul van Loosdrecht, University of Groningen (1.5 MB, en)
Structural chemistry and biochemistry
Lin X. Chen, ANL, Northwestern University (3.1 MB, en)
P. Coppens, University of Buffalo (1.0 MB, en)
Hyotcherl (Harry) Ihee, KAIST, Daejeon, Republic of Korea (3.0 MB, en)
Breakout session I: XRD
Eric Collet, University of Rennes (818KB, en)
Kristoffer Haldrup, University of Copenhagen (539KB, en)
A. Meents, HASYLAB / DESY (6.0 MB, en)
A. Plech, Karlsruher Institut für Technologie (728KB, en)
Breakout sessions II / III: XAS / XES / IXS
Federico Boscherini, University of Bologna (263KB, en)
Wojciech Gawelda, Spanish National Research Council (CSIC) (587KB, en)
Simo Huotari, ESRF (278KB, en)
Tommaso Mazza, University of Milan (1.1 MB, en)
Thorsten Schmitt, Paul Scherrer Institut (2.0 MB, en)
Marcin Sikora, AGH University of Science and Technology (675KB, en)
Grigory Smolentsev, University of Lund (1.1 MB, en)
Ulf Zastrau, University of Jena (981KB, en)
Session on XES / IXS
Bernhard W. Adams, APS / ANL (961KB, en)
Christian Bressler, European XFEL (2.3 MB, en)
Pieter Glatzel, ESRF (1.5 MB, en)
Session on XRD/XAS
S. L. Johnson, Paul Scherrer Institut (1.3 MB, en)
Martin Meedom Nielsen, University of Copenhagen (1.6 MB, en)
Alexander V. Soldatov, Southern Federal University, Rostov-on-Don (998KB, en)
First discussion on instrument parameters
Thomas Tschentscher, European XFEL (26KB, en)
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