European XFEL - Events - Users' meetings

Workshop/Conference

3rd European XFEL Users’ Meeting

Date: 28-29 January 2009

Location: DESY, Hamburg, Germany

The XFEL Users’ Meeting is an annual opportunity to deepen the interaction between the European XFEL Project and the scientific user community; the 3rd meeting focused on:

Informing the scientific community about the progress and current status of the European XFEL project
Providing the general scientific community with the results of the technical and scientific workshops that have occurred over the year 2008
Presenting current development in the area of X-ray FEL installations
Informing the scientific community about job opportunities at the European XFEL

Presentations
	Name	Title	Size
Opening session
	Albrecht Wagner, DESY	Welcome	3.1 Mb
Project status reports (Chair: Andreas Schwarz)
	Massimo Altarelli, European XFEL	Overview of the European XFEL project	3.2 Mb
	Hans Weise, DESY	The Accelerator Consortium	29.7 Mb
	Joachim Pflüger, DESY	Undulator systems	11.2 Mb
	Harald Sinn, European XFEL	Optics and beam transport	1,8 Mb
	Jérôme Gaudin, European XFEL	Radiation damage for optical elements	9.1 Mb
News from LCLS (Chair: Thomas Tschentscher)
	J. B. Hastings	Report on the status of LCLS	17.7 Mb
Reports from the workshops (Chair: G. Faigel)
	Chris Youngman, European XFEL	Data acquisition workshop and data management strategy	2.6 Mb
	M. Meyer, CNRS, Paris	SQS workshop 2008	15.3 Mb
	Janos Hajdu, Uppsala	SPB workshop 2008	5.8 Mb
	Justin Wark, University of Oxford	Forthcoming Workshop: HED workshop 2009	15.4 Mb
Time-dependent phenomena (Chair: C. Bressler)
	H. Schlarb, TU Berlin/FHI	Timing and synchronization	17.4 Mb
	H. Ihee, KAIST, Republic of Korea	Time-resolved scattering from solutions	16.2 Mb
Soft X-rays FEL spectroscopy (Chair: W. Wurth)
	Serguei L. Molodtsov, European XFEL	Spectroscopy of correlated materials: Challenge and FEL potentialities	7.9 Mb
	Marco Grioni, IPN EPFL	RIXS: Results and perspectives	10.1 Mb
	Zahid Hussain, ALS Berkeley	Scientific opportunities with soft X-rays for understanding emergent phenomena in complex materials	16.1 Mb